Equipment

Scanning Electron Microscopes

JEOL 6500F Field Emission SEM

Field Emission SEM
JEOL JSM-6500F Field Emission Scanning Electron Microscope
• 'Video Classroom' equipped for two-way interactive communications with remote sites via the Internet
• Backscattered and secondary electron detectors
• Digital image storage
• With attached X-EDS spectrometer and Oxford Instruments INCAEnergy+ software for electron beam-induced X-ray elemental analysis
    - with ultra-thin window (for boron and higher atomic number element detection)
• With attached EBSD detector and Oxford Instruments INCA Crystal software for Electron Backscatter Diffraction (EBSD) crystallographic analysis
• Maintained on service contract
• Resolution of secondary electron image:
    - 1.5 nm (at accelerating voltage 15kV)
    - 1.5 nm (at accelerating voltage 15kV)
    - 5.0 nm (at accelerating voltage 1kV)
• Accelerating voltage: 0.5 to 30 kV
• Magnification range: 10X to 500,000X

ZEISS EVO-50 Variable Pressure SEM

Carl Zeiss EVO50VP Variable Pressure Scanning Electron Microscope
• LaB6 emitter system
• Digital image storage
• Resolution of secondary electron image:
    - 2.0nm (at accelerating voltage 30kV)
• Resolution of backscattered electron image at variable pressure:
    - 4.5nm (at accelerating voltage 30kV)
• Extended Range Peltier Cooling Stage: Temperature Range: -30C to +50C
• Attached Bruker Quantax 200 X Flash EDX Spectrometer System (LN2-free high speed 30mm2 SDD Detector)
• Fullam Heating Stage to 1200C
• Accelerating voltage: 0.2-30kV
• Magnification range: 7X to 1,000,000X
• Will be maintained on service contract

HITACHI TM-1000 Table-Top SEM

Table-Top SEM
Hitachi TM-1000 Scanning Electron Microscope
• Easy to use
• Depth of Focus: 0.5mm
• Resolution: 30nm
• Magnification Range: 20-10,000
• Sample Size: Up to 70mm
• Stereoscopic
• Available for Outreach