Equipment

Transmission Electron Microscope

JEOL 1230 120kV TEM
  • JEOL 1230 120kV TEM
  • Tungston emitter
  • Accelerating voltage - 80 kV
  • Resolution: Point: .36 nm Lattice: .2 nm
  • Bottom mount Gatan Camera with Digital Micrograph Software
  • Single tilt holder
  • Based on MS Windows™ software
  • High-stability goniometer stage
  • 5 spot sizes
JEOL 2100 200kV TEM
  • LaB6 emitter
  • Accelerating voltage - 80,100,120,160,200 kV
  • Resolution: Point: 0.23 nm, Lattice: 0.14 nm
  • Oxford EDS system for elemental analysis and mapping
  • Bottom and side mount Gatan Cameras with Digital Micrograph Software
  • Double and single tilt holders
  • Based on MS Windows™ software
  • High-stability goniometer stage and the highest probe current for any given probe size, which allows for improved analytical and diffraction capabilities. The patented JEOL Alpha Selector™ allows a user the selection of a variety of illumination conditions, ranging from full convergent beam to parallel illumination