SEM is an advanced imaging instrument that employs electron beams to visualize the surface morphology of specimens with high resolution. By scanning the specimen, SEM generates detailed images, revealing micro- and nano-scale structural features crucial for scientific analysis in fields such as materials science and biology. SEM can be high-resolution imaging, elemental composition, surface analysis, material characterization, and 3D Imaging.

JEOL 6500 Field Emission SEM

Resources:

• Images
• User's Manual

Specifications:

Resolution on Secondary Electron Image	- 1.5 nm (at accelerating voltage 15kV) - 5.0 nm (at accelerating voltage 1kV)
Accelerating Voltage	0.5 to 30 kV
Magnification Range	10X to 500,000X
Attachments	X-EDS spectrometer and Oxford Instruments INCAEnergy+ software - for electron beam-induced X-ray elemental analysis Electron Backscatter Detector

Zeiss SUPRA 40

Resources:

• SOP Manual

Specifications:

Nominal Resolution	1.5 nm (at accelerating voltage 10kV)
Accelerating Voltage	Max. 30kV
Magnification Range	10X to 500,000X
Attachments	EDAX EBSD with OIM software

Hitachi TM-1000 Table Top SEM

Specifications:

Depth of Focus	0.5mm
Resolution	30nm
Magnification Range	20-10,000X
Sample Size	Up to 70mm