Transmission Electron Microscope
JEOL 2100 200kV TEM
TEM is a type of electron microscope that uses electrons instead of light to magnify a sample at a high resolution which allows the ability to study materials at micro- and nano- scale. This technique uses a beam of electrons transmitted through a specimen to produce an image. The TEM can produce high resolution images as well as other applications including elemental composition, structure resolving, and finding the structure of a crystal.
TEM is a type of electron microscope that uses electrons instead of light to magnify a sample at a high resolution which allows the ability to study materials at micro- and nano- scale. This technique uses a beam of electrons transmitted through a specimen to produce an image. The TEM can produce high resolution images as well as other applications including elemental composition, structure resolving, and finding the structure of a crystal.
Resources:
Specifications:
Specifications:
| Max Accelerating Voltage | 200 kV |
| Resolution Point | 0.23 nm, Lattice: 0.14 nm |
| Electron Emitter | LaB6 emitter |
| Sample holders | Single Tilt and Low Background double tilt |
| Attachments | - Oxford EDS system for elemental analysis and mapping - Bottom and side mount Gatan Cameras with Digital Micrograph Software |
